发明名称 |
MANUFACTURE OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE:To eliminate the formation of a compound consisting of phosphorus and titanium and to eliminate residues by an RIE method by a method wherein the concentration of phosphorus in a poly Si film is set 3X10<20>/cm<3> or less. CONSTITUTION:An SiO2 film 2 is formed on an Si substrate 1 by a thermal oxidation method and SiH4 is thermally decomposed by an LPCVD method to form a poly-Si film 3. Then, phosphorus is diffused in the poly-Si film 3 by a thermal diffusion method in a Pocl3-containing atmosphere to form an n<+> poly-Si film 3, a WSi2 film 4 and a TiSi2 film 5 are respectively formed by a sputtering method and a resist pattern 6 is formed. In this titanium silicide- containing polysilicide, the concentration of the P in the n<+> poly-Si film 3 is set to 3X10<20>/cm<3> or less. Thereby, unnecessary residues are not generated at the time of formation of a polysilicide pattern.
|
申请公布号 |
JPS63296357(A) |
申请公布日期 |
1988.12.02 |
申请号 |
JP19870132488 |
申请日期 |
1987.05.28 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
TATEIWA KENJI;FUSE HARUHIDE |
分类号 |
H01L21/302;H01L21/28;H01L21/3065;H01L21/3205;H01L23/52;H01L29/43;H01L29/78 |
主分类号 |
H01L21/302 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|