发明名称 C-BIT ERROR DETECTING CIRCUIT
摘要 PURPOSE:To decrease a circuit scale by sampling a C-bit and a bit just before, using a signal obtained as the result to convert the mBIC code rule into a low speed alternate rule, then supervising the alternate rule. CONSTITUTION:Means 2, 3 sampling a C-bit of mBIC (m Binary with 1 Complement Insertion) digital signal and a bit just before, means 4, 5 using a signal obtained the result of sampling by the means 2, 3 to convert the mBIC code rule into a low speed '1', '0' alternate rule, and means 6, 7 applying error detection of the '1', '0' alternate rule obtained by the means 4, 5 are provided. That is, the C bit and the bit just before are sampled, the signal obtained as the result is used to convert the mBIC code rule into a low speed '1', '0' alternate rule, then the alternate rule is supervised to detect the C bit error. Since the circuit consists of conventional OR gates and NOR gates only, the cost of the entire device is reduced and the circuit scale is decreased.
申请公布号 JPS63296544(A) 申请公布日期 1988.12.02
申请号 JP19870132090 申请日期 1987.05.28
申请人 NEC CORP 发明人 OZAKI HIROICHI
分类号 H04L1/00;H04L25/49 主分类号 H04L1/00
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