发明名称 SEMICONDUCTOR DEVICE HAVING MULTI-THICKNESS METALLIZATION AND PROCESS FOR THE FABRICATION THEREOF
摘要 Structure and method for metallization patterns of different thicknesses on a semiconductor device or integrated circuit. The improved structure and method utilizes three layers of metal in order to reduce the required number of processing steps. One preferred embodiment entails a single metal deposition sequence followed by two etch steps, while a second embodiment, suitable for thicker metallization, requires only two depositions and two etch steps.
申请公布号 GB2168846(B) 申请公布日期 1988.11.30
申请号 GB19850031175 申请日期 1985.12.18
申请人 * SGS MICROELETTRONICA SPA 发明人 CLAUDIO * CONTIERO;GIULIO * IANNUZZI;GIORGIO * DE SANTI;FABRIZIO * ANDREANI
分类号 H01L23/52;H01L21/28;H01L21/3205;H01L23/532;(IPC1-7):H01L23/48 主分类号 H01L23/52
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