发明名称 DEVICE FOR COMPENSATING CORROSION EFFECTS IN INTEGRATED SEMICONDUCTOR CIRCUITS
摘要 <p>Apparatus for compensating corrosion effects due to highly mobile positive ions in insulating oxides of integrated semiconductor circuits, including a ring being disposed on the surface of a semiconductor circuit and being connected to a negative voltage, the ring being formed of a material resistant to corrosion due to positive ions during the operation of semiconductor circuits.</p>
申请公布号 EP0075331(B1) 申请公布日期 1988.11.30
申请号 EP19820108787 申请日期 1982.09.22
申请人 SIEMENS AKTIENGESELLSCHAFT BERLIN UND MUNCHEN 发明人 GOETZ, ROLF JURGEN, DR. DIPL.-PHYS.
分类号 H01L23/52;H01L21/316;H01L21/3205;H01L23/00;H01L23/58;H01L29/40;(IPC1-7):H01L23/56;H01L23/54 主分类号 H01L23/52
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