发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE:To prevent the short circuit among the electrodes after the second layer by causing the end part of a first-layer electrode formed, including the element region, on an element isolation film having a thick central part and a thin peripheral part to remain on the upward slope side of the element isolation film. CONSTITUTION:On a semiconductor substrate 1, an element isolation region 2 is formed which consists of an element isolation film that is thick in the central part thereof and thin in the peripheral part thereof. And the end part of a first-layer electrode 3 formed on the region 2 including an element region 6 is formed so that it is positioned at the center side of the electrode 3 forming region ranging with the end of the electrode 3 from the central part of the region 2. A taper is formed in the end part of the electrode 3, and the taper formed by the region 2 and the taper angle made by the end part of the electrode 3 are overlapped so that they are offset. On the electrode 3, a second-layer electrode 5 is formed through an insulating film 4.
申请公布号 JPS63293875(A) 申请公布日期 1988.11.30
申请号 JP19870127924 申请日期 1987.05.27
申请人 TOSHIBA CORP 发明人 MORITA SHIGERU
分类号 H01L27/10;H01L21/8242;H01L27/108 主分类号 H01L27/10
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