发明名称 X-ray exposure system
摘要 An X-ray exposure system including a plurality of X-ray exposure apparatuses each for duplicating a mask pattern on a semiconductor wafer by irradiating an X-ray mask and the semiconductor wafer with synchrotron radiation is disclosed in which a synchrotron radiation path branching device including a reflecting mirror is disposed between a synchrotron ring and the X-ray exposure apparatuses, and the propagation direction of the synchrotron radiation emitted from the synchrotron ring is changed by the reflecting mirror so that the synchrotron radiation from the ring can be introduced into each of the X-ray exposure apparatuses.
申请公布号 US4788698(A) 申请公布日期 1988.11.29
申请号 US19870028024 申请日期 1987.03.17
申请人 HITACHI, LTD. 发明人 KIMURA, TAKESHI;MOCHIJI, KOZO;ASAI, SHOJIRO;OBAYASHI, HIDEHITO
分类号 G03F7/20;(IPC1-7):G21K5/00 主分类号 G03F7/20
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