发明名称 PSEUDO FAULT GENERATING SYSTEM
摘要 PURPOSE:To improve the inspection accuracy of a program, by designating the generating part of a pseudo fault by combining a specific position in a program targeted to be inspected and an specific passing position of the fault prior to the above specific position. CONSTITUTION:An initialization part 12, after receiving pseudo fault generation information from an input part 11 and registering it in a storage part 15, saves original instructions I, I1-In existing in a pseudo fault generating position A in the program 10 targeted to be inspected and the fault passing positions a1-an respectively from the program 10 targeted to be inspected to the storage part 15. After that, when a first start up instruction already set at the fault passing position a1 is executed according to the travel of the program 10 targeted to be inspected, a fault passing position monitoring part 13 is started up by the above execution. When a second start up instruction already set at the pseudo fault passing position A of the program 10 targeted to be inspected is executed in parallel with the monitoring of the fault passing position, a pseudo fault generating part 14 is started up by the above execution. In such a way, by generating the pseudo fault fitting to the specific part on the travel path of the program targeted to be inspected the inspection accuracy of the program can be improved.
申请公布号 JPS63292244(A) 申请公布日期 1988.11.29
申请号 JP19870127454 申请日期 1987.05.25
申请人 NEC CORP 发明人 YANO MASAYUKI
分类号 G06F11/28;G06F11/22 主分类号 G06F11/28
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