发明名称 |
OVERVOLTAGE PROTECTOR FOR SEMICONDUCTOR CIRCUIT DEVICE |
摘要 |
PURPOSE:To provide a low limiting voltage against an overvoltage by a method wherein a semiconductor layer for transistor use is formed inside a semiconductor region and a collector layer and a base layer whose conductivity type is opposite to that of the collector layer are connected in series so that a reverse- direction voltage can be impressed. CONSTITUTION:A semiconductor layer for transistor use is formed inside a semiconductor region 13 which is separated electrically from a substrate 10. A collector layer 21 and a base layer 22 whose conductivity type is opposite to that of the collector layer at least in the semiconductor layer for transistor use are connected in series between a wiring part 50 to be protected against an overvoltage and an operating reference potential point of a semiconductor circuit device so that a reverse-direction voltage can be impressed on a semiconductor junction between the layers. While the reverse-direction voltage is impressed between the collector layer and the base layer, the overvoltage is limited by their breakdown strength or breakdown voltage. By this setup, a protective device can have a limiting voltage which is lower than a conventional limiting voltage and which is best fitted to a characteristic of a circuit element.
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申请公布号 |
JPS63289856(A) |
申请公布日期 |
1988.11.28 |
申请号 |
JP19870124503 |
申请日期 |
1987.05.21 |
申请人 |
FUJI ELECTRIC CO LTD |
发明人 |
KURODA EIJU;MARUYAMA HIROSHI |
分类号 |
H01L29/73;H01L21/331;H01L21/822;H01L23/62;H01L27/04;H01L27/06;H01L29/72;H01L29/732;H02H9/04 |
主分类号 |
H01L29/73 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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