| 摘要 |
A device (1) for testing and sorting electronic components, particularly chips (20), comprising an input magazine (12), followed by a separating device (15), followed by an interchangeable test unit (4) in which the components are contacted by a contacting drive (53) with a test base (52), with an output magazine (13), with a movable sorting shuttle (19) and with an exit stop element (76) at the shuttle (19), is to be designed in such a manner that the exit stop element (76) is operable even with a shuttle (19) which cannot be rotated across the plane of the output magazine (13). This is achieved by the test unit (16) exhibiting at least one drive (53, 66) which is mechanically connected to an adjustable coupling member (78) which, in turn, is mechanically effectively connected to the exit stop element (76) of the shuttle (19). <IMAGE>
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