| 摘要 |
<p>A system for testing semiconductor components (47) such as TTL components and CMOS components to determine whether the input (26), output (36) and ground pins (53) are conductively connected to a circuit, such as the circuit of a printed circuit board, and whether proper conductive paths exist between the connector pins and the ground pin (53) through the semiconductor. This is accomplished by providing a current pulse on one terminal to generate a voltage drop across an inherent resistance of the component (47) which is connected in series with the other terminal of the component and detecting the resulting voltage drop to show that the input and output terminals, as well as the ground terminal, are properly connected to the printed circuit board.</p> |
