发明名称 DIRECT EMISSION SPECTROCHEMICAL ANALYZER OF MOLTEN METAL
摘要 PURPOSE:To analyze rapidly and directly each component contained in a molten metal sample in a production site by using an excited light focusing constitution from just above direction against the molten metal surface and a focusing tube constitution to which an opposing electrode and a focusing lense are provided. CONSTITUTION:The focusing lense 5 and the opposing electrode 8 whose top end 8' is near the lense 6 are fixed at lower end part of the focusing tube 2. Inner part of an emitting chamber 1 is fixed with gaseous Ar and is lowered by an elevator 24, and the gap between the end 8' and a bath surface is held to prescribed distance by a bath surface level sensor 10 and a controller 23 of gap between electrodes. An emitting device 29 is functioned to perform spark discharge between the end 8' and a molten metal 22 surface. The emitted light intensity is measured by a spectral detector 27, spectral beam intensity of each constituent is corrected by a calculator 28, and contained percentage of each constituent contained in the molten metal is obtained.
申请公布号 JPS5981539(A) 申请公布日期 1984.05.11
申请号 JP19820191087 申请日期 1982.10.30
申请人 SHIN NIPPON SEITETSU KK 发明人 ONO AKIHIRO
分类号 G01N21/67;G01N21/69 主分类号 G01N21/67
代理机构 代理人
主权项
地址