发明名称 DETECTING METHOD FOR DEFECT IN TERMINAL CRIMPING OF TERMINAL-CRIMPED ELECTRIC CONDUCTOR
摘要 PURPOSE:To detect the terminal crimping defect of an electric conductor by detecting a force applied to a press at the time of terminal crimping, acquiring variation in the force with time as a pattern, and deciding the defect in crimping. CONSTITUTION:When a pattern pressure part crimps a terminal, a reaction is applied to a ram 6 in the crimping and a column 6a is strained. This strain is detected 10 and a corresponding electric signal V is outputted. The signal V is amplified 21 and inputted to an A/D converter 22 and a comparator 23. Then the signal V is compared 23 with a reference signal Vs and when V>Vs, a trigger signal Pt is outputted to trigger the converter 22. The converter 22 when applied with the trigger signal Pt samples the waveform of the input signal V, performs A/D conversion, and stores the waveform in a memory 4 in time series. A CPU 25 stores the signal waveform in a normal crimping state which is stored and compares the normal waveform with the waveform of each crimped terminal successively to decide whether or not the waveform is normal, thereby outputting an abnormality decision signal V0 when deciding the waveform is abnormal.
申请公布号 JPS63281071(A) 申请公布日期 1988.11.17
申请号 JP19870114423 申请日期 1987.05.13
申请人 FURUKAWA ELECTRIC CO LTD:THE 发明人 ABE FUMIHIKO;YAMAMOTO YOSHIO;YAMAGUCHI SHIZUKA
分类号 G01R31/04;G01R31/00;H01R43/048 主分类号 G01R31/04
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