| 摘要 |
There is an electrical device providing testing of a usable contact gap 1, a test instrument 10 being provided for testing the closing resistance 4, 5 and the opening resistance 6, 7 of the usable contact gap 1. In its arrangement it is desirable if a repetitive testing of the usable contact gap is possible without closing the usable contact gap, with low circuit and instrumentation complexity. This is achieved in that the usable contact gap 1 is formed by two series-connected contact gap switches 2, 3 which are jointly operated for usable switching, and that input and output of both contact gap switches 2, 3 can be connected via a change-over test switch 9 to a test instrument 10 constructed as four-terminal 14, 15, 16, 17 test instrument. Subdividing the usable contact gap into two contact gap switches allows the closing resistance of the two contact gap switches, thus the usable contact gap, to be tested successively without having to close the usable contact gap overall. <IMAGE>
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