发明名称 |
SEMICONDUCTOR RADIATION DETECTOR |
摘要 |
PURPOSE:To obtain a semiconductor radiation detector, which presents high detection efficiency without change in sensitivity with time, by providing a tellurium oxide layer between a metal electrode layer and a cadmium telluride crystal to prevent formation of a barrier layer between the cadmium telluride crystal and the metal electrode layer so that good ohmic contact may be formed. CONSTITUTION:A Te layer is deposited on one face of a high-resistance CdTe crystal 1 with a resistivity of 10<8>-10<10>OMEGAcm by vacuum evaporation and thermally oxided to form a TeOX layer 2. An Au electrode 3 is formed on the TeOX layer 2 by vacuum evaporation. A TeOX layer 2 and an Au electrode 3 are also laminated on the other face of the CdTe crystal 1 by a similar method, and thus a full depletion layer type CdTe radiation detector is constituted. Since there is no barrier layer on the junction interface between the Au electrode 3 and the TeOX layer 2 and no space charge is accumulated, an extremely stable semiconductor radiation detector is realized which operates for a long time without the change in detection sensitivity.
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申请公布号 |
JPS63274182(A) |
申请公布日期 |
1988.11.11 |
申请号 |
JP19870110215 |
申请日期 |
1987.05.06 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
OOTSUCHI TETSUO;OOMORI YASUICHI;TSUTSUI HIROSHI;BABA MATSUKI;WATANABE MASANORI |
分类号 |
H01L21/28;H01L31/0264;H01L31/04;H01L31/09;H01L31/108 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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