发明名称 VISUAL APPEARANCE CHECKER FOR SEMICONDUCTOR WAFER
摘要 <p>PURPOSE:To prevent completely the generation of cracks and dusts on the surface of a semiconductor wafer, by making a semiconductor wafer accommodated in a cassette ascend without inclination by a wafer lifting plate. CONSTITUTION:A wafer lifting plate 4 is provided on the upper part with a groove 5 to retain a semiconductor wafer without inclination. The wafer lifting plate 4 is retained by a lifting plate guide 6, and driven by a lifting level 7 being in contact with the bottom of the wafer lifting plate 4. By lowering a handle on the opposite side of a fulcrum 8 of the lever 7, the water lifting plate 4 is raised along the guide 6, and a semiconductor wafer 1 protrudes in the upper part of a cassette 2 for semiconductor wafer. Thereby, the visual appearance of the semiconductor wafer 1 can be check by a visual checking without generating new cracks and dusts on the wafer surface.</p>
申请公布号 JPS63275130(A) 申请公布日期 1988.11.11
申请号 JP19870111847 申请日期 1987.05.07
申请人 YAMAGUCHI NIPPON DENKI KK 发明人 KINOSHITA KATSUYUKI
分类号 H01L21/677;H01L21/66;H01L21/68 主分类号 H01L21/677
代理机构 代理人
主权项
地址