| 摘要 |
PURPOSE:To eliminate the manipulation of the definition of light source output power and the change-over of a light path while enabling measurement in a long light path, by simultaneously calculating the ratio of infrared powers before passing a specimen and after passing the same by using two infrared detectors. CONSTITUTION:Infrared rays emitted from infrared semiconductive laser 1 are made incident to light converging optical systems 22, 3 through beam splitter 21 and amplified by an amplifier 5 while subjected to photoelectric conversion by infrared detectors 23, 4 to obtain signal voltage. when signal voltages simultaneously obtained by amplifiers 24, 5 when a specimen 10 is absent in a specimen passing optical light path 25 are set to V01, V02 and signal voltages obtained when the specimen 10 is present are set to V11, V12, the infrared transmissivity of the specimen 10 is calculated by a formula V12,/V11 and, when sensitivity difference is present in two infrared detectors 4, 23, standardized infrared transmissivity is calculated from a formula (V12/V11)/(V02/V01). |
