发明名称 Surface defect detection and confirmation system and method.
摘要 <p>A surface inspection defect detection and confirmation technique in which a beam of radiation is directed at the surface to be inspected; the radiation scattered from the surface is separately sensed in the near-specular region indicative of a pit and in the far-specular region indicative of a flaw, the near-specular region signal and far-specular region signal are normalized, the near-specular component is discriminated, and the flaw signal is indicated as being a defect and not contamination when there is coincidence between the pit signal and flaw signal.</p>
申请公布号 EP0290228(A2) 申请公布日期 1988.11.09
申请号 EP19880304004 申请日期 1988.05.03
申请人 QC OPTICS INC 发明人 QUACKENBOS, GEORGE S.;ORMSBY, JAY L.;NISHINE, KOICHI;CHASE, ERIC T.;BROUDE, SERGEY V.
分类号 G01B11/30;G01N21/88;G01N21/94;G01N21/95 主分类号 G01B11/30
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