发明名称 TAKE-OUT METHOD AND DEVICE FOR CUT WAFER
摘要 PURPOSE:To prevent collision of a wafer with a turning frame of a blade and destruction of the wafer by making the wafer into a state where the same is integrated with a suction plate at the time when the wafer is cut off, by a method wherein the suction plate is sucked to an ingot by holding the suction plate stably by a holding device. CONSTITUTION:A suction plate 6 in a state where the same is connected with a stopper flange 16b is positioned by moving the same until an opening for suction comes into contact with the bottom of an ingot 1 by moving a rigid shaft 61a upward by a moving device. The suction plate 6 and ingot 1 are sucked and integrated by feeding negative pressure to the opening for the suction through a vacuum tube 66. The rigid shaft 61a is moved downward by inverting the moving device to a position where a predetermined gap is kept between the flange 61b and suction plate 6 and force holding the suction plate 6 substantially becomes a state where the force other than suction force due to air suction does not act upon. Cutting operation of a wafer is performed under this state. When the wafer is separated from the ingot, the suction plate 6 integrated with the wafer is dropped and connected with the stopper flange 61b by fitting to the same.
申请公布号 JPS63270103(A) 申请公布日期 1988.11.08
申请号 JP19870107055 申请日期 1987.04.30
申请人 TOSOH CORP 发明人 UENO YOSHIYUKI;IHARA YOSHINAO
分类号 B28D5/00;B28D5/02 主分类号 B28D5/00
代理机构 代理人
主权项
地址