发明名称 MANUFACTURE OF BIMOS SEMICONDUCTOR DEVICE
摘要 PURPOSE:To enhance a characteristic of a horizontal-type transistor without increasing the number of production processes by a method wherein a doping operation of the same concentration as that of a well for a MOS transistor is executed to a base region of the horizontal-type transistor. CONSTITUTION:Because an n-type epitaxial layer becomes a base region 3 for a pnp transistor as a horizontal-type transistor, an additional doping operation to the region is executed simultaneously with an n-type doping operation to a well for a p-channel MOS transistor. The doping operation to the well region 12 for the p-channel MOS transistor is executed at a doping concentration of about 10<16> atoms/cm<2> and with a thickness of 2 mum. The doping operation at the same concentration and with the same depth is executed to the base region 3 for the pnp transistor. The horizontal-type transistor 51 where an emitter layer 5, a collector layer 6 and a base layer 6 are formed inside an additionally doped base layer 13 is constituted in this manner.
申请公布号 JPS63269559(A) 申请公布日期 1988.11.07
申请号 JP19870104091 申请日期 1987.04.27
申请人 FUJI ELECTRIC CO LTD 发明人 NAGAYASU YOSHIHIKO;SHIGETA YOSHIHIRO
分类号 H01L21/8249;H01L21/331;H01L27/06;H01L29/72;H01L29/73;H01L29/732 主分类号 H01L21/8249
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