发明名称 APPARATUS FOR MEASURING INFRARED TEMPERATURE DISTRIBUTION
摘要 PURPOSE:To shorten the measuring time required in the preparation of a plurality of pictures and to display even the change component of temp. distribution as a thermogram by one measurement, by performing sampling on the basis of a plurality of the pulses within each cycle of infrared ray emission. CONSTITUTION:The infrared ray energy emitted from an object to be measured during scanning is converted to a signal. A plurality of delay times are set within each cycle of this cycle signal and (n)-kinds of pulse trains shifted in a phase at the same cycle little by little are formed to drive sample holding circuit SH1-SHn. Each circuit SH holds (n)-kinds of pixel signals corresponding to the same set period within each cycle from the signal corresponding to the temp. from a signal processing circuit. Respective pixel signals are stored in the corresponding memories M1-Mn and subsequently taken out as RGB signals or NTSC signals to be displayed as a thermogram.
申请公布号 JPS63269026(A) 申请公布日期 1988.11.07
申请号 JP19870103875 申请日期 1987.04.27
申请人 NIPPON DENKI SANEI KK 发明人 KUROKAWA MASARU
分类号 G01J5/48;H04N5/33 主分类号 G01J5/48
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