| 摘要 |
PURPOSE:To improve the dielectric strength and the leak-current characteristics, by a method wherein the deteriorated parts of the dielectric oxide film of a solid electrolytic capacitance are directly restored with manganese dioxide covering the above oxide film, in an atmosphere in which manganese dioxide displays most of its forming properties. CONSTITUTION:In the manufacturing process of a solid electrolytic capacitor, a manganese dioxide layer is formed, and then left for about 30 minutes in an environment where the atmosphere temperature is 2 deg.C and the relative humidity is 70%. After that, a voltage of 80V is impressed for 30 minitutes by applying tantalum and manganese dioxide to an anode and a cathode, respectively. Then, according to the conventional manufacturing method, a graphite layer, a silver layer, and taking-out leads are arranged, and finished goods are obtained by sheathing with resin. When the dielectric strength, the leak-current characteristics, the electrostatic capacitance and the loss are compared with each other, there are no influence on the electrostatic capacitance and the loss characteristics, and remarkable improving effects are recognized for the dielectric strength and the leak-current characteristics.
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