DEVICE FOR MEASURING, AT A PLURALITY OF POINTS, THE MICROWAVE FIELD DIFFRACTED BY AN OBJECT

摘要

A source (2) of microwave radiation illuminates an object (1). Electrical doublet antennas (3) changed by diodes (4) are arranged in a line on the path of the radiation diffracted by the object (1). A guiding structure (5) provided with coupling antennas (55)is arranged along the line of doublet antennas (3) and collects the diffracted radiation. Electronic circuits (6, 7, 8) control the assembly in order to measure the diffracted field at the site of each doublet antenna (3). The device is applicable to non-destructive testing of objects, materials or industrial products being conveyed, for example, as well as to radiation systems.