| 摘要 |
A self learn technique for a circuit tester such as a manufacturing defect analyser involves grounding each and every node on a known good circuit board, discharging two chosen nodes, applying a stimulus voltage to one of the chosen nodes, removing the grounding from the second chosen node and monitoring the voltage developed on the second node. By comparing the voltage with a threshold value a component can be identified between the nodes. By repeating the procedure over all pairs of nodes the circuit tester can learn component positions and types on the board. |
