| 摘要 |
A digital signal scrambler for use in testing semiconductor memory circuits such as RAMs. The scrambler is comprised of look-up tables in conjunction with EXCLUSIVE OR logic circuitry, for receiving generated address and data signals and transmitting scrambled signals in response thereto, conforming to the predefined topological scrambling function of the memory circuit being tested. The digital signal scrambler of the present invention is of simple and inexpensive design, is easy to use and typically occupies very little circuit board area.
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