Positioning fixture for integrated circuit chip testing board

摘要

A fixture for clamping an integrated circuit chip testing board having a plurality of contact points to a testing platform having a plurality of corresponding protruding metal pins. The fixture includes a hinged cover with a latch for automatically aligning the testing board parallel to the testing platform and a means for automatically disabling the power supplied to the testing platform when the cover is opened and enabling the power when the cover is closed. The automatic alignment of the testing board parallel to the testing platform assures that the electrical connections between the contact points and their corresponding metal pins are substantially identical to thereby reduce testing errors caused by nonuniformity in the electrical interconnections.