发明名称 DOUBLE CONVERGENCE MASS SPECTROMETER USING WIEN FILTER
摘要 PURPOSE:To make it possible to simultaneously detect daughter ions, by arranging a two-dimensional detector in a position where a double convergence condition is effected to a series of daughter ions generated from one parent ion and having different values of mass. CONSTITUTION:An ions beam emitted from an unillustrated ion source and accelerated to have prescribed energy passes through a main slit 1 to be incident on an Wien filter 3. A series of daughter ions having different values of mass are generated due to dissociation in a free space in the mean time. Since these daughter ions have almost equal speed to that of a parent ion, they pass through the filter 3 en mass e when this speed satisfies the Wien condition and the ions except these can not pass through because they do not satisfy the Wien condition. A beam having passed through the filter 3 is spatially separated according to a difference in each mass by a magnet 4 for performing primary angle alpha convergence and speed beta convergence. The condition of double convergence is effected at the point where the surface 5 for performing this alpha convergence and the surface 6 performing, beta convergence are accorded with each other. Accordingly, when a two-dimensional detector is placed in the position of the above two convergence surfaces, simultaneous detection of the daughter ions can be made.
申请公布号 JPS63259955(A) 申请公布日期 1988.10.27
申请号 JP19870092604 申请日期 1987.04.15
申请人 JEOL LTD 发明人 MATSUDA HISASHI;NAITO NORIHIRO
分类号 G01N27/62;H01J49/28;H01J49/32 主分类号 G01N27/62
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