| 摘要 |
PURPOSE:To achieve a higher measuring accuracy of a particle size distribution, by representing scattered light of fine particles outside a range of a measuring object by a distribution pattern of intensity of scattered light based on a Rayleigh theory. CONSTITUTION:A scattered light intensity vector of particles within a range of a measuring object is determined on a Fraunhofer diffraction theory and Mie scattering theory to form a computation matrix with the scattered light intensity vector as matrix. Then, on a Rayleigh theory, a scattered light pattern vector of fine particles is determined as existing outside the range of the measuring object. Moreover, a scattered light pattern vector of the fine particles present outside the range of the measuring object is added as new one row of computation matrix with respect to a computation matrix constituted by the scattered light pattern vector of the particles within the range of the measuring object. A data of a scattered light intensity distribution actually measured by a forward microangle scattering method is subjected to a computation processing by a computation matrix to determine a particle size distribution free from the effect of fine particles outside a measuring range.
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