发明名称 DEBUG SYSTEM FOR TEST PROGRAM
摘要 PURPOSE:To allow the titled system to simplify the simulate means and to cope with versatile peripheral equipment by effectively utilizing an expected value of a test program and allowing a pseudo fault information designation means to set the device status attended with an optional input/output operation. CONSTITUTION:When a console 82 is designated as an input source device of a pseudo fault data, a test program monitor 42 displays a pattern inquiring about an input/output routine desired to be an object onto the console 82. When a prescribed input is finished, a start number designated to a pseudo fault registration table is set to start the execution of a test program 41. Then a macroinstruction processing compares the input/output processing number of the input/output processing routine to be executed from now with all start numbers of the table and when no coincident number exists, it is processed there is no pseudo fault setting in the succeeding series of input/output operations and the expected value of the program 41 is used as an actual value. When the coincident number exists, a pseuso fault item to be set is inquired at each occasion of execution of instruction and when the required information is set, simulation is executed according to the information.
申请公布号 JPS63257839(A) 申请公布日期 1988.10.25
申请号 JP19870091946 申请日期 1987.04.16
申请人 NEC CORP 发明人 OMOTO OSAMU
分类号 G06F11/28;G06F11/22 主分类号 G06F11/28
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