发明名称 MANUFACTURE OF THIN FILM TRANSISTOR
摘要 <p>PURPOSE:To prevent picture elements and the like from becoming turbid in white, by using mixed gas, which does not include hydrogen, then using hydrogen based mixed gas, and forming a gate insulating layer by a CVD method. CONSTITUTION:A gate electrode 2 and a picture element electrode 3 are formed on a glass substrate 1. Then, a first silicon nitride film 91 is formed by a glow- discharge plasma CVD method by using mixed gas, which comprise silicon hydride, ammonia and nitrogen and does not include hydrogen. Then, a second silicon nitride film 92 is formed by the similar plasma CVD method by using hydrogen based mixed gas comprising silicon hydride, ammonia and hydrogen. Then an a-Si:H film is formed and patterned, and a semiconductor layer 5 is formed. Thereafter the first and second silicon nitride films 91 and 92 are patterned, and a gate insulating film 9 is obtained. Then, an Al film is formed and patterned, and a source electrode 6 and a drain electrode 7 are formed. Thus the TFT is completed.</p>
申请公布号 JPS63257234(A) 申请公布日期 1988.10.25
申请号 JP19870091322 申请日期 1987.04.14
申请人 ALPS ELECTRIC CO LTD 发明人 SASAKI MAKOTO;IWASAKI CHISATO;FUKUI HIROFUMI;KASAMA YASUHIKO
分类号 H01L21/318;G02F1/133;G02F1/136;G02F1/1368;G09F9/30;H01L27/12;H01L29/78;H01L29/786 主分类号 H01L21/318
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