Process for the continuous, contact-free measurement of layer thicknesses and apparatus for performing the process

摘要

Disclosed is a process and apparatus for measuring, in a continuous and contact-free manner, the thickness of a layer applied to a support. The apparatus includes a measuring apparatus which comprises a corona and a first electrostatic voltmeter positioned downstream of the corona in the direction of travel of the layer being measured. The process includes the steps of passing the layer under the apparatus, charging the layer in a contact-free manner, and measuring the level of the charging voltage.