发明名称 Laser furnace and method for zone refining of semiconductor wafers
摘要 A method of zone refining a crystal wafer (116 FIG. 1) comprising the steps of focusing a laser beam to a small spot (120) of selectable size on the surface of the crystal wafer (116) to melt a spot on the crystal wafer, scanning the small laser beam spot back and forth across the surface of the crystal wafer (116) at a constant velocity, and moving the scanning laser beam across a predetermined zone of the surface of the crystal wafer (116) in a direction normal to the laser beam scanning direction and at a selectible velocity to melt and refine the entire crystal wafer (116).
申请公布号 US4780590(A) 申请公布日期 1988.10.25
申请号 US19850800227 申请日期 1985.11.21
申请人 PRC CORP 发明人 GRINER, DONALD B.;ZUR BURG, FREDERICK W.;PENN, WAYNE M.
分类号 C30B13/24;C30B13/28;H01L21/00;(IPC1-7):B23K26/00 主分类号 C30B13/24
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