发明名称 SOLID-STATE IMAGE SENSING DEVICE
摘要 PURPOSE:To make the sensitivity between devices uniform by a method wherein the thickness of a light-transmitting film on a photodetector part of a photodiode is made uniform so that a smear phenomenon can be reduced. CONSTITUTION:N-type impurity layers 4 which are isolated by guard rings 3 and act as photodetector parts of a photodiode and N-type impurity layers 5 constituting transmission lines are formed at a well 2 on the surface of a substrate 1; gates 7 for transmission use which are composed of polycrystalline silicon layers in order to read out a signal charge and to transmit it are formed on the surface of the substrate 1 via a gate insulating film; a light-transmitting oxide film 8 is formed in such a way that the photodetector parts composed of the impurity layers 4 covered with an oxide film 6 can be flattened; furthermore, a light-shielding film 9 composed of an Al film where the photodetector parts are opened is formed on the oxide film 8.
申请公布号 JPS63257266(A) 申请公布日期 1988.10.25
申请号 JP19870092215 申请日期 1987.04.14
申请人 NEC CORP 发明人 KAMATA TAKAO
分类号 H01L27/148;H04N5/335;H04N5/359;H04N5/365;H04N5/369;H04N5/3728 主分类号 H01L27/148
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