| 摘要 |
PURPOSE:To enable comparison with a test data group to be performed even when a reference data group is remarkably increased without making a system into a system large in scale, by comparing the test data group consisting of a large number of digital signals with a large number of reference signal groups set in advance. CONSTITUTION:In a processing device, a terminal A to which test data is inputted and a terminal B to which reference data is inputted are provided, and to the terminal A, a large number of FF circuits C1-Cn are connected in series. To the terminal B, evaluation accumulators D1-Dn are connected in parallel respectively. Then, the test data group is inputted to the terminal A in order. At this time, when the reference data is inputted to the terminal B, the evaluation accumulators D1-Dn compare and compute the test data S1-Sn outputted from the FF circuits with the reference data R1 based on a prescribed evaluation function, and the accumulated values of the computed values are outputted. By comparing those output values, it is possible to decide the coincidence of the test data with the reference data.
|
