| 摘要 |
PURPOSE:To detect the cause of the fault of a photoconductive cell and the fault due to the cutoff of a lamp or the defect of a card, by punching all of the bits on the leading column of the card, and reading, a code in which all bits are punched by the photoconductive cell when the card is inserted to a card reader. CONSTITUTION:When the card is inserted to the card reader, the leading column of the card is moved in order from the leading column of the photoconductive cell. All of the areas can be checked by reading the columns of the photoconductive cell to the final column. At this time, the position of the OFF bit of the column where the OFF of the bit is detected first, and the bit OFF of the column coming at the next are detected, and when they are on the same position, it is decided as the cutoff of the lamp. Also, it is decided as the fault of the photoconductive cell in one bit or even plural bits on the same column. Next, the card is read, and horizontal and vertical parity check are performed. At this time, it is decided as the defect of the punched hole of the card itself if an error is generated. Thereby, it is possible to detect the fault of the card reader of punched card system.
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