发明名称 COMPONENT INSPECTION DEVICE
摘要 PURPOSE:To easily inspect various kinds of components with high reliability by holding a component to be inspected at a constant attitude and setting a turntable so that its one surface contacts the conduction part of the component to be inspected and the other surface abuts on an inspection position. CONSTITUTION:The turntable 7 is equipped with a component normalizing part 8 which holds the attitude of the component 6 to be inspected constant and an abutting element 9 which contacts the conduction part of the component 6 to be inspected on one surface and abuts on the contact 10 on the other surface at the inspection position. Then when the component 6 to be inspected is carried to the inspection position and the contact 10 is elevated, the contact 10 does not abut directly on the conduction part of the component 6 to be inspected, but abuts on the reverse surface of the abutting element 9 to determine inspection conditions. Consequently, even when a component 6 of different size is inspected, the shape of the abutting element 9 is unchanged, so the contact 10 need not be shifted in installation position.
申请公布号 JPS63250573(A) 申请公布日期 1988.10.18
申请号 JP19870086041 申请日期 1987.04.08
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 YAMASHITA KOICHI
分类号 G01R31/00;G01R31/18 主分类号 G01R31/00
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