发明名称 Thickness measuring apparatus for sheet material
摘要 PCT No. PCT/EP85/00178 Sec. 371 Date Dec. 18, 1986 Sec. 102(e) Date Dec. 18, 1986 PCT Filed Apr. 19, 1985 PCT Pub. No. WO86/06471 PCT Pub. Date Nov. 6, 1986.A thickness measuring apparatus for sheet material has before the actual measuring gap a pretest sensing element which responds to overthicknesses in the material under test transported to the apparatus and, if necessary, swivels the measuring system out of the plane of transport. This avoids jamming in the transport system and damage to or maladjustment of the measuring system. A triggering mechanism which cooperates with the pretest sensing element can be designed in such a way that the measuring system is swiveled away only in the case of a definite adjustable force. After a disturbance the measuring system is automatically returned to the original position.
申请公布号 US4777729(A) 申请公布日期 1988.10.18
申请号 US19860002713 申请日期 1986.12.18
申请人 GAO GESELLSCHAFT FUR AUTOMATION UND ORGANISATION MBH 发明人 HAEUSLER, AUGUST
分类号 B65H7/06;B65H7/12;G01B5/06;G01B7/06;G01B21/08;G07D7/00;G07D7/16;(IPC1-7):G01B21/08 主分类号 B65H7/06
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