发明名称 AMORPHOUS SILICON IMAGE SENSOR
摘要 PURPOSE:To prevent the generation of a leak current between each of individual electrode groups, by shielding perfectly an unnecessary part for irradiation between discrete electrodes neighboring with each other via amorphous silicon. CONSTITUTION:On a substrate 1, a reed screen-type discrete electrode group 4 is made in the form of a film, by applying a metal member for forming a Schottky barrier. On the discrete electrode group 4, amorphous silicon 3 is overlapped to form a film. On the amorphous silicon 3, a film of common electrode 6 is formed, composed of a light-shielding type metal film in the form of a linear belt having a specified width in the rectangular direction to the discrete electrode 4. The common electrode 6 is provided with a slit 7 in the longitudinal direction, and light is introduced through the slit 7. A dimension L part and a dimension L' part of the discrete electrode groups 4 neighboring with each other via the amorphous silicon 3 can be completely shielded, so that the generation of a leak current between each of the discrete electrode groups 4 can be prevented.
申请公布号 JPS63249367(A) 申请公布日期 1988.10.17
申请号 JP19870083510 申请日期 1987.04.03
申请人 FUJITSU LTD 发明人 OGAWA TETSUYA;TAKOJIMA TAKENAO;TOSHIMA HIROAKI
分类号 H01L27/146;H04N5/335;H04N5/369 主分类号 H01L27/146
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