发明名称 LIFT-OFF COMPENSATION OF EDDY CURRENT PROBES
摘要 This invention relates to a method and apparatus for compensating the output signal of a reflection type eddy current probe so as to minimize the change in the phase shift of the probe output signal that otherwise would occur as a result of a change in the spacing of the probe from the surface of the metal sample being inspected or investigated.
申请公布号 DE3377941(D1) 申请公布日期 1988.10.13
申请号 DE19833377941 申请日期 1983.09.28
申请人 AMF INCORPORATED 发明人 BAINS, JAMES A., JR.
分类号 G01N27/90;G01V3/10;(IPC1-7):G01N27/90 主分类号 G01N27/90
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