发明名称 METHOD AND APPARATUS FOR MEASURING DENSITY OF IMPURITIES IN CRYSTAL
摘要 PURPOSE:To calculate the density of impurities indicating excitation of a non- harmonic vibration element, by measuring an elastic constant of a crystal sample at a low temperature for which effect of non-harmony of a lattice vibration can be ignored to be compared with an elastic constant of a highly pure semiconductor. CONSTITUTION:A measuring bar 5 having a sample measuring box 4 at the lower end thereof is inserted into a liquid helium tank 13 made up of three low-temperature tanks of a low-temperature cryostal 1. When a pulse signal from a pulse generator 31 is applied, a transducer 31a generates an ultrasonic vibration by piezoelectric effect and causes one end of a crystal sample 2 in the sample measuring box 4 to vibrate. A transducer 32a converts the ultrasonic vibration transmitted to the other end of the crystal sample 2 into an electrical pulse and a sound velocity of the ultrasonic pulse transmitted through the crystal sample 2 is measured with an ultrasonic pulse detector 32. An elastic coefficient is calculated from the sound velocity to be compared with an elastic coefficient of a highly pure crystal thereby calculating the density of inpurities in the crystal sample.
申请公布号 JPS63246654(A) 申请公布日期 1988.10.13
申请号 JP19870077469 申请日期 1987.04.01
申请人 FUJITSU LTD 发明人 KANEDA HIROSHI;OGAWA TSUTOMU;MORI HARUHISA;WADA KUNIHIKO
分类号 G01N29/00;H01L21/66 主分类号 G01N29/00
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