发明名称 TESTER FOR SEMICONDUCTOR DEVICE
摘要 PURPOSE:To prevent run off of an external lead when brought into contact with a contact while enabling a long-life test, by pressing the external lead on the contact with a comb-shaped insulation leak keep plate to perform a test. CONSTITUTION:A ZIP type IC1 conveyed being guided on a guide groove 3a of a guide rail 3 is put between the guide groove 3a and a guide groove 4a at a testing position with an opposed rail 4 lowering in the direction 7. Then, leads 1a of the ZIP type IC1 are inserted into cuts 6a and 6b with a lead keep plate 6 lowering in the direction 8 to be insulated. Moreover, with the lead keep plate 6 lowering in the direction 9 as a whole, the guide rail 3 and the opposed rail 4, the ZIP type IC1 is tested as fixed by pressing the undersurface of the external leads 1a on a contact 5 one piece at a time.
申请公布号 JPS63246685(A) 申请公布日期 1988.10.13
申请号 JP19870081618 申请日期 1987.04.01
申请人 MITSUBISHI ELECTRIC CORP 发明人 NAKAJIMA HIROYUKI;NISHIBASHI RYOJI;KOBAYASHI KUNIO
分类号 G01R31/26;H01L21/66 主分类号 G01R31/26
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