发明名称 INSTRUMENT FOR MEASURING INFRARED SCATTERING INTENSITY
摘要 <p>PURPOSE:To obtain a measuring instrument which can easily measure scattering intensity when a material to be measured is in a component stage by calculating the scattering intensity of the material to be measured from the output received power signal and differential signal of a signal detecting circuit. CONSTITUTION:A laser beam source 1 outputs variable wavelength laser beam, and a laser power source 14 applies sine-wave modulation on the laser beam, which is scanned. The scanned laser beam is made parallel through a collimator lens 18 and the parallel light is branched to a reference optical path 3 and a measurement optical path 4 by the branching means 7 composed of a beam splitter 5 and a reflecting mirror 6. The material 18 whose transmission is to be measured is put in the measurement optical path 15 and scattered light 9 from the material 8 and the transmitted light of reference light 3 are put together by a composing means 10 which uses a reflecting mirror 15, a beam splitter 16, and a converging mirror 17. A detector 11 light-receives and converts the composite light into an electric signal and a signal detecting circuit 12 detects the received power signal and differential signal from the output signal of the detector 11. A scattering intensity calculation part 13 calculates the scattering intensity of the material 8 from the output received power signal and differential signal of the signal detecting circuit 12.</p>
申请公布号 JPS63243839(A) 申请公布日期 1988.10.11
申请号 JP19870080366 申请日期 1987.03.31
申请人 FUJITSU LTD 发明人 DOI SHOJI;SAWADA AKIRA;SUGIYAMA IWAO
分类号 G01N21/3563;G01N21/35;G01N21/45;G01N21/49 主分类号 G01N21/3563
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