发明名称 SCATTERED LIGHT DETECTOR
摘要 PURPOSE:To instantaneously detect the angular distribution of the intensity of scattered light with high accuracy and high sensitivity by allowing a ring-shaped sensor composed of many semiconductor photodetecting elements to detects the scattered light arriving from a direction perpendicular to its surface by discriminating its position. CONSTITUTION:A cylindrical sample cell 1 is formed of a transparent material and liquid or gas where a group of particles to be measured is suspended and dispersed is put or flows therein. Then homogeneous light of necessary wavelength from a light source 2 is collimated by a collimator 3 into thin parallel luminous flux L11, which is projected on the sample cell 1 and scattered by the particle group in the sample. A part of scattered light La1 emitted radially from the sample cell 1 strikes on the cylindrical incidence surface 4a of a ring-shaped prism 4 and is reflected totally by a cylindrical surface 4b and incident on detecting elements 5 through a projection surface 4c. The elements generate photoelectric outputs proportional to the intensity of the momentarily incident light at the same time by elements sectioned into sectorial planes. The respective outputs are amplified and A/D-converted by a signal processing part 6 and inputted to a data processing system 7 to calculate the momentary grain size distribution, which is displayed and recorded 8.
申请公布号 JPS63243840(A) 申请公布日期 1988.10.11
申请号 JP19870078861 申请日期 1987.03.31
申请人 SHIMADZU CORP 发明人 NIWA TAKESHI
分类号 G01N15/02;G01N21/47;G01N21/51 主分类号 G01N15/02
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