发明名称 Apparatus and methods for testing surface properties of a material
摘要 An apparatus for testing the surface properties of a material is disclosed. The apparatus includes an indentor which is suspended above the surface of a sample and dropped onto the sample. Several testing methods are also disclosed. Surface toughness is measured by dropping the indentor from a variable height and inspecting the surface for failure. Thin film strength is tested by making several drops from various heights and inspecting the surface for flaking of the layer. In addition, damping capacity can be measured by comparing the kinetic energy of the resulting from the drop of the indentor to the strain energy measured by a probe on the opposing surface of the sample.
申请公布号 US4776202(A) 申请公布日期 1988.10.11
申请号 US19870096185 申请日期 1987.09.11
申请人 MAGNETIC PERIPHERALS INC. 发明人 BRAR, AMARJIT S.;SHARMA, JAGDISH P.;KAJA, SURYANARAYANA
分类号 G01N3/00;G01N3/30;G01N3/48;G01N19/04;G01N33/38;(IPC1-7):G01N3/30 主分类号 G01N3/00
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