发明名称 MEASURING APPARATUS FOR PROPERTY OF SURFACE
摘要 PURPOSE:To obtain the accurate measured values of glossiness and flatness of the same place by one measuring operation, by multiplying the measured value of glossiness by a correction factor in accordance with the property of the flatness so as to remove the effect of flatness. CONSTITUTION:When the flatness of a surface to be measured is bad considerably, a measured value of glossiness is smaller than a true value and an error increases. To cope with this state, correction is made in accordance with the degree of lessening from the true value. When a start switch is pressed, concretely, a switch circuit 14 is switched over by an instruction from a CPU 16. The CPU 16 measures flatness and glossiness sequentially and makes them to be shown as the results of measurement in a display. On the occasion, the flatness is displayed as it is, while, as to the glossiness, the measured glossiness multiplied by a correction factor corresponding to the flatness is displayed. This constitution enables the attainment of a surface property measuring apparatus wherein the glossiness of the surface to be measured, such as a coated surface, which is not affected by the flatness at all and the flatness thereof are measured and displayed simultaneously.
申请公布号 JPS63243711(A) 申请公布日期 1988.10.11
申请号 JP19870078138 申请日期 1987.03.31
申请人 TOKAI RIKA CO LTD 发明人 KANO YUKIO;YOSHIKAWA KUNIYUKI;KISHIDA TAKAAKI
分类号 G01B11/30;G01N21/57;G01N21/88 主分类号 G01B11/30
代理机构 代理人
主权项
地址