| 摘要 |
PURPOSE:To select even partially usable chips easily after a die sort test by writing information regarding the failure generating positions of each chip at the time of a die sort test into a writing region. CONSTITUTION:Memory sections such as eight ones S1-S8 are formed to a chip body 10. An information writing section 20 for writing various information such as a result at the time of a die sort test is shaped into a region except the memory sections for the chip body 10 such as the right upper region of the chip. Consequently, PASSes and FAILs can be selected by the formation of a hole in a column 21 for the region I of the information writing section 20. When the chip is decided as the FAIL, the degree of the failure can easily be determined. That is, the positions of columns to which holes are formed in the regions II and III of the information writing section 20 may be inspected on FAILs. Accordingly, even partially usable chips are easily selected after a die sort test process.
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