发明名称 DRY ETCHING METHOD
摘要 PURPOSE:To dissipate the heat of a semiconductor substrate at the time when the semiconductor base body is dry-etched efficiently to an etching pedestal through a fixing substance, and to prevent the thermal deformation of the semiconductor substrate by interposing the fixing substance between the etching pedestal and the semiconductor substrate placed onto the pedestal. CONSTITUTION:A fixing jig 3 to which a GaAs substrate 1 is fastened is placed onto a cooled etching pedestal 6 in an RIE device. A photosensitive resin 7 such as positive type resist Az is dripped onto the etching pedestal 6 at that time, and the fixing jig 3 is laminated. That is, a fixing substance such as the photosensitive resin 7 is interposed between the etching pedestal 6 and the fixing jig 3. Consequently, the GaAs substrate 1 is installed into the RIE device, and the surfaces exposed through openings in a mask 4 for RIE for the GaAs substrate 1 are etched through an RIE method. Etching is completed, through-holes reaching the surface of the GaAs substrate 1 are formed, and source electrodes S are exposed. Au 5 is evaporated onto the inner walls of the through-holes including the exposed source electrodes S and the whole rear of the GaAs substrate 1 through a vacuum deposition method, and the source electrodes S are connected mutually, thus completely shaping via holes.
申请公布号 JPS63239818(A) 申请公布日期 1988.10.05
申请号 JP19870071653 申请日期 1987.03.27
申请人 TOSHIBA CORP 发明人 IZUMI HIDEAKI
分类号 H01L21/302 主分类号 H01L21/302
代理机构 代理人
主权项
地址