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发明名称
MEMORY TEST PATTERN GENERATOR
摘要
申请公布号
EP0225642(A3)
申请公布日期
1988.10.05
申请号
EP19860117204
申请日期
1986.12.10
申请人
ADVANTEST CORPORATION
发明人
IMADA, HIDEAKI
分类号
G11C29/00;G01R31/28;G01R31/319;G11C29/56;(IPC1-7):G11C29/00
主分类号
G11C29/00
代理机构
代理人
主权项
地址
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