发明名称 |
DRY ETCHING POSSIBLE POLY-LAYER RESIST FORMING METHOD USING GRAFT POLYMERIZATION BY ELECTRON BEAM |
摘要 |
(1) coating photoresist on a silicone wafer and baking at over 200≦̸C for 1 hr; (2) coating silicone resin on the photoresist layer and scanning high energy electron beam to form a reactive group at the scanning area; (3) forming a graft polymer layer by reacting with vaporized organic monomer; and (4) etching silicone resin between patterns of the graft polymer layer by reactive-ion-etching with CF4/H2 vapor.
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申请公布号 |
KR880001954(B1) |
申请公布日期 |
1988.10.04 |
申请号 |
KR19850010131 |
申请日期 |
1985.12.31 |
申请人 |
GOLD STAR CO.,LTD. |
发明人 |
PARK, CHEOL-HONG |
分类号 |
H01L21/306;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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