发明名称 DRY ETCHING POSSIBLE POLY-LAYER RESIST FORMING METHOD USING GRAFT POLYMERIZATION BY ELECTRON BEAM
摘要 (1) coating photoresist on a silicone wafer and baking at over 200≦̸C for 1 hr; (2) coating silicone resin on the photoresist layer and scanning high energy electron beam to form a reactive group at the scanning area; (3) forming a graft polymer layer by reacting with vaporized organic monomer; and (4) etching silicone resin between patterns of the graft polymer layer by reactive-ion-etching with CF4/H2 vapor.
申请公布号 KR880001954(B1) 申请公布日期 1988.10.04
申请号 KR19850010131 申请日期 1985.12.31
申请人 GOLD STAR CO.,LTD. 发明人 PARK, CHEOL-HONG
分类号 H01L21/306;(IPC1-7):H01L21/306 主分类号 H01L21/306
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