发明名称 Transmission electron microscope
摘要 A transmission electron microscope for irradiating a sample with an electron beam and for causing an image formation lens system to enlarge the electron beam having passed through the sample so that a magnified image of the sample is formed by the electron beam. The image formation lens system includes a plurality of lens groups each having a plurality of electromagnetic lenses, and the focal length of each of the electromagnetic lenses included in at least one lens group is changed while keeping the resultant focal length of each lens group constant, to rotate the magnified image in a state that the magnification of the image is kept constant.
申请公布号 US4775790(A) 申请公布日期 1988.10.04
申请号 US19860871852 申请日期 1986.06.09
申请人 HITACHI, LTD. 发明人 KOBAYASHI, HIROYUKI;ISAKOZAWA, SHIGETO
分类号 H01J37/10;H01J37/26;(IPC1-7):H01J37/26 主分类号 H01J37/10
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