发明名称 Integrated circuit having capacitive process-scatter compensation
摘要 In integrated circuits the delay of the signal transitions has to lie within specified limits. This delay is partly determined by variations in the manufacturing process (process scatter). To compensate for the effect of this scatter a load capacitance is connected via a switching element to a node which is to be influenced in the integrated circuit. The switching element receives a reference voltage which is dependent on the manufacturing process and is generated by reference source, so that the node capacitance 26 is connected to the node for a longer or shorter time, depending on the process scatter.
申请公布号 US4775806(A) 申请公布日期 1988.10.04
申请号 US19860935488 申请日期 1986.11.26
申请人 U.S. PHILIPS CORPORATION 发明人 PFENNINGS, LEONARDUS C. M. G.;VEENDRICK, HENDRIKUS J. M.;VAN ZANTEN, ADRIANUS T.
分类号 H01L27/04;G05F1/46;H01L21/822;H03K19/003;(IPC1-7):H03K3/356;H03K4/58;H03K17/14;H03K17/16 主分类号 H01L27/04
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